Surface investigations of ZnBeMnSe mixed crystals by means of the piezoelectric spectroscopy and the AFM technique

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dc.contributor.authorStrzałkowski, Karol
dc.contributor.authorKulesza, Sławomir
dc.contributor.authorZakrzewski, Jacek
dc.contributor.authorMaliński, Mirosław
dc.date.accessioned2017-03-01T09:29:31Z
dc.date.available2017-03-01T09:29:31Z
dc.date.issued2014
dc.description.abstractPiezoelectric photoacoustic spectroscopy with a piezoelectric detection has been used for measurements of the amplitude and phase spectra of Zn1-x-yBexMnySe mixed semiconductors. The investigated crystals were grown from the melt by the modified high pressure Bridgman method under the argon overpressure. The preliminary study of the sample’s surface of the investigated crystals was carried out using the AFM technique. The influence of a different surface treatment on the amplitude and phase piezoelectric spectra as well as on AFM images is presented and analyzed. The correlations between these two techniques have been found and are discussed. Piezoelectric (PZE) spectra were analyzed using an extended and modified Jackson-Amer theory.pl
dc.identifier.citationAppl. Surf. Sci. 290 (2014); pp. 27 - 34pl
dc.identifier.issn0169-4332
dc.identifier.otherhttp://dx.doi.org/10.1016/j.apsusc.2013.10.180
dc.identifier.urihttp://repozytorium.umk.pl/handle/item/4090
dc.language.isoengpl
dc.publisherElsevierpl
dc.rightsinfo:eu-repo/semantics/openAccess
dc.subjectA2B6 semiconductorspl
dc.subjectAFM techniquepl
dc.subjectDiluted magnetic semiconductorspl
dc.subjectMixed crystalspl
dc.subjectPiezoelectric detectionpl
dc.subjectSurface of semiconductorspl
dc.titleSurface investigations of ZnBeMnSe mixed crystals by means of the piezoelectric spectroscopy and the AFM techniquepl
dc.typeinfo:eu-repo/semantics/articlepl

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