A Deeper Insight into (Lu,Y)AG:Pr Scintillator Crystals
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IOP Science
Abstract
Interior of Czochralski-grown (Lu,Y)AG:Pr crystals has been examined by means of
several techniques, such as X-Ray Photoelectron Spectroscopy, X-Ray Diffraction,
Time-of-Flight Secondary Ion Mass Spectrometry, and magnetic susceptibility measurements. Additionally, their luminescence has been monitored at various combinations of a double-beam (X-ray/IR) excitation.
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LuYAG:Pr, XPS, XRD, ToF-SIMS, wzbudzanie dwuwiązkowe
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IOP Conference Series: Materials Science and Engineering
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